Search results
Solid-State Electronics > 2018 > 139 > C > 115-120
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
Materials Science in Semiconductor Processing > 2017 > 68 > C > 302-315
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1674 - 1682
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 382 - 387
Thin Solid Films > 2016 > 616 > C > 408-414
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2722 - 2728
SID Symposium Digest of Technical Papers > 47 > 1 > 1737 - 1739
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Reliability and Operation of SOI Devices in Harsh Environment > 121-132
Microelectronics Reliability > 2016 > 58 > C > 158-163
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 272 - 279
Materials Science in Semiconductor Processing > 2016 > 41 > C > 485-490